TEO 200-X Benchtop FTIR Spectrometer with resolution upgrade to 0.5

The TEO-200-X series of FTIR spectrometers represent a low cost Fourier transform infrared spectrometers and employ a number of unique features that ensure high performance from a compact instrument. The 200-X measures just 59 X 39 X 19 cm and is regarded as one of the most compact and versatile infrared FTIR spectrophotometers. The design of the 200-X is unique both in terms of optical design and the software and firmware designed specifically to significantly reduce overall analytical times. The interferometer geometry employs a new compact Michelson self compensating optical system that eliminates many of the optical alignment problems found in conventional type optical interferometers. The 200-X design avoids the use of conventional corner cube optics and dynamic alignment. In practice this means that the instrument can be used in the research laboratory, in any university or college environment and if required, can also be used outside laboratory or in remote locations.

The sample compartment is large and can accommodate all of the normal sample handling requirements relating to FTIR spectroscopy. This unique compartment will also accommodate a wide range of accessories supplied by specialist accessory manufacturers. Overall dimensions are W20 X D26 X H16 cm . The optical axis is 74.5 mm above the base of the sample compartment and there is free space of 90 mm above the optical axis to the underside of the lid.

In order to facilitate the use of more than one beam splitter or detector , provisions have been made to interchange the beam splitter and detector assemblies allowing the 200-X to be used at any wavelength from 15000 to 400 cm-1.

Beam Splitters Range subject to coatings
KBr 7,800 to 380 cm-1
ZnSe 5,000 to 500 cm-1
Fused silica 15,000 to 3,000 cm-1